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LCR Meters | Impedance Analyzers | Capacitance Meters

Hioki LCR Meters Murah Impedance Analyzers, up to 3 GHz IMPEDANCE ANALYZER   IM7587 1MHz...

Hioki LCR Meters Murah

Impedance Analyzers, up to 3 GHz

IMPEDANCE ANALYZER IM7587

IMPEDANCE ANALYZER   IM7587

1MHz to 3GHz Measurement Frequency Impedance Analyzer with 0.5ms Test Speed and 0.07% Variability
• |Z|, L, C, R testing • Testing source frequency: 1 MHz to 3 GHz • Measuring time: 0.5 ms • Measure LCR and conduct frequency sweeps simultaneously
IMPEDANCE ANALYZER IM7580A

IMPEDANCE ANALYZER   IM7580A

1MHz to 300MHz Measurement Frequency Impedance Analyzer with 0.5ms Test Speed and Superior Repeatability
• |Z|, L, C, R testing • Testing source frequency: 1 MHz to 300 MHz • Measuring time: 0.5 ms • Measure LCR and conduct frequency sweeps simultaneously
IMPEDANCE ANALYZER IM7581

IMPEDANCE ANALYZER   IM7581

100kHz to 300MHz Measurement Frequency Impedance Analyzer with 0.5ms Test Speed
• |Z|, L, C, R testing • Testing source frequency: 100 kHz to 300 MHz • Measuring time: 0.5 ms • Measure LCR and conduct frequency sweeps simultaneously
IMPEDANCE ANALYZER IM7585

IMPEDANCE ANALYZER   IM7585

1MHz to 1.3GHz Measurement Frequency Impedance Analyzer with 0.5ms Test Speed and 0.07% Variability
• |Z|, L, C, R testing • Testing source frequency: 1 MHz to 1.3 GHz • Measuring time: 0.5 ms • Measure LCR and conduct frequency sweeps simultaneously
IMPEDANCE ANALYZER IM7583

IMPEDANCE ANALYZER   IM7583

1MHz to 600MHz Measurement Frequency Impedance Analyzer with 0.5ms Test Speed
• |Z|, L, C, R testing • Testing source frequency: 1 MHz to 600 MHz • Measuring time: 0.5 ms • Measure LCR and conduct frequency sweeps simultaneously
CHEMICAL IMPEDANCE ANALYZER IM3590

CHEMICAL IMPEDANCE ANALYZER   IM3590

For R & D applications of Electrochemical Components and Materials, Batteries, and EDLCs
• |Z|, L, C, R, σ, ε testing • Battery measurement • 1 mHz to 200 kHz • 2 ms measurement time
EQUIVALENT CIRCUIT ANALYSIS FIRMWARE IM9000

EQUIVALENT CIRCUIT ANALYSIS FIRMWARE   IM9000

Simple Circuit Analysis & Detailed Acceptance/Rejection Decision-Making
Firmware Upgrade for the IM3570
• Optional software for Model IM3570 • 5 equivalent circuit models • Plot frequency characteristics graph from analysis results • Cole-Cole plot, admittance circle display
IMPEDANCE ANALYZER IM3570

IMPEDANCE ANALYZER   IM3570

Single Device Solution for High Speed Testing and Frequency Sweeping
• |Z|, L, C, R testing • 4 Hz to 5 MHz • 0.5 ms measurement time • Measure LCR and conduct frequency sweeps simultaneously

LCR Meters, 200 kHz to 8 MHz

LCR METER IM3536

LCR METER   IM3536

General-Purpose LCR Meters with Measurement Frequency from DC, 4Hz to 8MHz
• |Z|, L, C, R testing • Testing source frequency: DC, or 4 Hz to 8 MHz • Measuring time: 1 ms • Accuracy guaranteed range from 1mΩ
LCR METER IM3523

LCR METER   IM3523

Ideal for Production Lines of Electronic Parts and Automated Testing
• |Z|, L, C, R testing • Testing source frequency: 40 Hz to 200 kHz • Measuring time: 2 ms
LCR METER IM3533

LCR METER   IM3533

From R&D Applications to Windings, Coil and Transformer Manufacturing
• |Z|, L, C, R testing • Testing source frequency: 1 mHz to 200 kHz • Measuring time: 2 ms • Transformer measurement mode

LCR Meters | Capacitance Meters, 1 kHz, 120 Hz

Capacitance Meter | C Meter 3506-10

C METER   3506-10

Dual-band 1kHz/1MHz Capacitance Meter for High Speed Testing of Ceramic Capacitors on Production Lines
• C, D (tan δ), Q, and low capacitance testing • 1 kHz, 1 MHz • 1.5 ms measurement time at 1 MHz
Capacitance Meter | C HiTester 3504 Series

C HiTESTER   3504

Dual-band 120Hz/1kHz Capacitance Meter for High Speed Inspection of Multi-Layer Ceramic Capacitors (MLCC) on Taping Machines
• C, D (tan δ), high capacitance MLCC testing • 120Hz or 1kHz • 2 ms measurement time
LCR Meter | LCR HiTester 3511-50

LCR HiTESTER   3511-50

Compact, dual-band 120Hz/1kHz LCR Meter for Integration into Automated Production Lines
• |Z|, L, C, R testing • 120Hz or 1kHz • 5 ms measurement time

Test fixture or Probes

SMD TEST FIXTURE IM9201

SMD TEST FIXTURE   IM9201

3GHz High Frequency Test Fixture for 6 Different SMD Sizes
• Direct connection two-terminal measurement type • DC to 3 GHz • Measurable sample sizes: 0201 to 1210 (EIA)
SMD TEST FIXTURE IM9110

SMD TEST FIXTURE   IM9110

High-precision two-terminal fixture for measuring ultra small “008004” (EIA) components
• Direct connection two-terminal measurement type • DC to 1 MHz • Measurable sample sizes: 008004 (EIA)
SMD TEST FIXTURE IM9100

SMD TEST FIXTURE   IM9100

High-precision four-terminal measurement for ultra small size 01005 (EIA)
• Direct connection type • SMDs with electrodes on the bottom • DC to 8MHz • Measurable sample sizes: 01005 to 0402 (EIA)
PINCHER PROBE L2001

PINCHER PROBE   L2001

Measurement for small size “0603” (EIA)
• DC〜8MHz • 50Ω • Tip electrode spacing: 0.3 (0.01 in) to 6 mm (0.24 in)

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